Abbreviation of the 24th China International Plast

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The 24th China International Plastics and Rubber Industry Exhibition (hereinafter referred to as "Chinaplas 2010 International Rubber and Plastics Exhibition") will be held in Shanghai soon!

date: April 19-22, 2010

location: Shanghai New International Expo Center (Pudong)

exhibition opening time:

April (0930-17:30)

April 22 (0930-15:00)

exhibition scale:

exhibition area is more than 150000 square meters, Display more than 1900 machines and the latest raw materials

more than 2100 Chinese and foreign exhibitors from more than 30 countries and regions

10 countries/regions to test the working conditions of high-temperature furnace electronic universal experimental machine: the regional exhibition groups include Austria, Canada, France, Germany, Italy, Japan, Britain, the United States Only China and Taiwan, China province of China can conduct official experiments.

it is expected that 75000 professional visitors from more than 130 countries/regions will be welcomed.

well-known exhibitors at home and abroad will display the industry's most cutting-edge technology and machinery and equipment that are close to the industry trend. Many exhibitors have uploaded their latest exhibit information to the official website of the conference, such as the new low molecular weight polypropylene polymer production line introduced by Baker petroleum The eco IMM injection molding machine controller of baccarat, the lq-vario laser plastic welding technology of LPKF, the plastic recycling system of erema combined with ecosave technology, the pla-l extruded bar of Gehr plastics, the Ecco ultrasonic electronic measurement system of iNOEX - the electronic solution for rapid centering of pipes, the smash surface detector of Isra vision, and the keplast injection molding machine control system are the measurement and determination system in this area due to the modulus, etc

please browse the official website of the exhibition to download more exhibitors, so that each load can only reach a certain load of information:

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